{"title":"Defektid","description":"\u003cp\u003e\u003cstrong\u003eDefektid\u003c\/strong\u003e – sellest kategooriast leiad 59 raamatut. Tunnustatud klassikast uusimate väljaanneteni. Telli internetist, tarnime üle Eesti.\u003c\/p\u003e","products":[{"product_id":"understanding-housing-defects-9780080971124","title":"Eluasemeprobleemide mõistmine","description":"\u003cp\u003e Raamat „Understanding Housing Defects” annab kokkuvõtliku, sidusa ja põhjaliku sissejuhatuse elamute defektide põhjustesse, uurimisse ja diagnoosimisse.\u003c\/p\u003e\n\u003cp\u003e Selles uues väljaandes on paljusid peatükke oluliselt uuendatud ja lisatud on uusi fotosid. Seal on neli uut peatükki, mis käsitlevad:\u003c\/p\u003e\n\u003cul\u003e\n\u003cp\u003e\u003c\/p\u003e\n\u003cli\u003e Kuidas defekte defineeritakse\u003c\/li\u003e\n\u003cp\u003e\u003c\/p\u003e\n\u003cli\u003e Ülevaade ehitus- ja arhitektuuriajaloost\u003c\/li\u003e\n\u003cp\u003e\u003c\/p\u003e\n\u003cli\u003e Välised tisleritööd ja värvitud viimistlus\u003c\/li\u003e\n\u003cp\u003e\u003c\/p\u003e\n\u003cli\u003e Keskkonna- ja terviseprobleemid hoonetes\u003c\/li\u003e\n\u003c\/ul\u003e \u003cp\u003ePaljud 21 peatükist käsitlevad konkreetset ehituselementi ja sisaldavad lühikest sissejuhatust, milles kirjeldatakse ehituspõhimõtteid ja praeguse praktika arengut. Kõik peatükid käsitlevad levinud (ja mõnikord ka mitte nii levinud) defektide tuvastamist, põhjuseid ja diagnoosimist. See raamat on kohustuslik kõigile õpilastele ja praktikutele, kes vajavad laia arusaama elamudefektidest.\u003c\/p\u003e\n\u003cp\u003e Ehitusinspektorid, üldpraktika inspektorid, arhitektid, kinnisvaramaaklerid, eluasemeametnikud ja kõik, kes tegelevad kinnisvara haldamise ja hooldamise ning ehitamisega, saavad sellest informatiivsest värvilisest tekstist tohutult kasu. Raamat, mille kirjutasid \u003ci\u003e„Majade ehituse“ autorid,\u003c\/i\u003e on ka loomulik kaaslane sellele menuraamatule.\u003c\/p\u003e","brand":"Roger Heath","offers":[{"title":"Default Title","offer_id":50986386620758,"sku":"9780080971124","price":90.72,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780080971124.jpg?v=1754315184"},{"product_id":"understanding-building-failures-9780415508797","title":"Ehitusvigade mõistmine","description":"\u003cp\u003e See klassikaline õpik annab põhjaliku sissejuhatuse hoonete defektide uurimisse ning seejärel headesse tavadesse mõõdistamise, konserveerimise ja remondi alal. Tänu uuele materjalile uusimate tehnoloogiate ja protseduuride kohta ning ajakohastatud lisalugemise nimekirjadele Ühendkuningriigis ja USAs on see endiselt suurepärane kaaslane nii praktikutele kui ka üliõpilastele.\u003c\/p\u003e","brand":"James Douglas","offers":[{"title":"Default Title","offer_id":51023096709462,"sku":"9780415508797","price":72.53,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780415508797.jpg?v=1754685890"},{"product_id":"building-surveys-and-reports-9781405197618","title":"Building Surveys and Reports","description":"\u003cp\u003eExplore the essential resource for building professionals with \u003cstrong\u003eBuilding Surveys and Reports\u003c\/strong\u003e by James Douglas. Published in 2011, this comprehensive guide spans 428 pages, offering invaluable insights into building survey work across various types of structures, including residential, commercial, and industrial buildings.\u003c\/p\u003e \n\n\u003cp\u003eDelve into detailed advice on diagnosing a wide array of defects, equipping yourself with the knowledge needed to assess both modern and historical construction methods. With a focus on both new and traditional materials, this book serves as a critical tool for anyone involved in building inspections or seeking to enhance their understanding of building conditions. Enhance your expertise with this indispensable guide by James Douglas, a trusted authority in the field.\u003c\/p\u003e","brand":"James Douglas","offers":[{"title":"Default Title","offer_id":51432399733078,"sku":"9781405197618","price":63.99,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9781405197618.jpg?v=1759034246"},{"product_id":"zur-problematik-der-sogenannten-weiterfressenden-maengel-nach-dem-allgemeinen-deliktsrecht-und-dem-produkthaftungsgesetz-peter-lang-gmbh-internationaler-verlag-der-wissenschaften-9783631468715","title":"Zur Problematik der sogenannten weiterfressenden Maengel nach dem allgemeinen Deliktsrecht und dem Produkthaftungsgesetz","description":"\u003cp\u003e\u003cstrong\u003eZur Problematik der sogenannten weiterfressenden Maengel nach dem allgemeinen Deliktsrecht und dem Produkthaftungsgesetz\u003c\/strong\u003e by Marlies Brinkmann.\u003c\/p\u003e\n\u003cp\u003ePublished by P. Lang, (1994), Paperback, 186 pages.\u003c\/p\u003e\n\u003cp\u003eTopics: Defects, Manufactures, Products liability.\u003c\/p\u003e","brand":"Bookshop","offers":[{"title":"Default Title","offer_id":52223083610454,"sku":"9783631468715","price":67.16,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9783631468715.jpg?v=1767736043"},{"product_id":"understanding-housing-defects-taylor-francis-ltd-9780415622080-duncan-marshall","title":"Understanding Housing Defects","description":"\u003cp\u003e\u003cstrong\u003eUnderstanding Housing Defects\u003c\/strong\u003e by Duncan Marshall, Derek Worthing, Roger Heath, Nigel Dann.\u003c\/p\u003e\n\u003cp\u003ePublished by Estates Gazette, (2014), Hardback, 560 pages.\u003c\/p\u003e\n\u003cp\u003eTopics: Dwellings, maintenance and repair, Dwellings, Defects.\u003c\/p\u003e","brand":"Duncan Marshall","offers":[{"title":"Default Title","offer_id":52225255866710,"sku":"9780415622080","price":243.5,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780415622080.jpg?v=1767738791"},{"product_id":"understanding-building-failures-taylor-francis-ltd-9780415508780-james-douglas","title":"Understanding Building Failures","description":"\u003cp\u003eThis classic textbook provides a solid introduction to the study of defects in buildings and, subsequently, to good practice in surveying, conservation and repair. With new material on the latest technologies and procedures, and updated lists of further reading for the UK and USA, this remains an excellent companion for practitioners and students alike.\u003c\/p\u003e","brand":"James Douglas","offers":[{"title":"Default Title","offer_id":52225295745366,"sku":"9780415508780","price":231.38,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780415508780.jpg?v=1767738837"},{"product_id":"unintended-or-sudden-acceleration-in-automobiles-nova-science-publishers-inc-9781617289835-denise-m-mcmann","title":"Unintended or Sudden Acceleration in Automobiles","description":"\u003cp\u003e\u003cstrong\u003eUnintended or Sudden Acceleration in Automobiles\u003c\/strong\u003e by Denise M. McMann.\u003c\/p\u003e\n\u003cp\u003ePublished by Nova Science Publishers, (2011), Paperback, 103 pages.\u003c\/p\u003e\n\u003cp\u003eTopics: Automobiles, Government policy, Defects, Fuel systems.\u003c\/p\u003e","brand":"Denise M. McMann","offers":[{"title":"Default Title","offer_id":52225323303254,"sku":"9781617289835","price":157.4,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9781617289835.jpg?v=1767738882"},{"product_id":"toyota-automobiles-unintended-acceleration-nova-science-publishers-inc-9781613242759-craig-a-orrigo","title":"Toyota Automobiles \u0026 Unintended Acceleration","description":"\u003cp\u003e\u003cstrong\u003eToyota Automobiles \u0026amp; Unintended Acceleration\u003c\/strong\u003e by Craig A. Orrigo.\u003c\/p\u003e\n\u003cp\u003ePublished by Nova Science Publishers, (2011), Hardback, 207 pages.\u003c\/p\u003e\n\u003cp\u003eTopics: Fuel systems, Defects, Toyota automobiles, Automobiles.\u003c\/p\u003e","brand":"Craig A. Orrigo","offers":[{"title":"Default Title","offer_id":52226319810902,"sku":"9781613242759","price":345.34,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9781613242759.jpg?v=1767739909"},{"product_id":"theory-of-radiation-processes-in-metal-solid-solutions-nova-science-publishers-inc-9781560722601-yu-v-trushin","title":"Theory of Radiation Processes in Metal Solid Solutions","description":"\u003cp\u003e\u003cstrong\u003eTheory of Radiation Processes in Metal Solid Solutions\u003c\/strong\u003e by Trushin, I͡U. V..\u003c\/p\u003e\n\u003cp\u003ePublished by Nova Science Publishers, (1995), Hardback, 411 pages.\u003c\/p\u003e\n\u003cp\u003eTopics: Metals, Effect of radiation on, Defects, Metals.\u003c\/p\u003e","brand":"Yu V. Trushin","offers":[{"title":"Default Title","offer_id":52226749202774,"sku":"9781560722601","price":179.23,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9781560722601.jpg?v=1767740581"},{"product_id":"technology-of-building-defects-taylor-francis-ltd-9781138177390-john-hinks","title":"Technology of Building Defects","description":"\u003cp\u003eDiscover a comprehensive exploration of structural integrity with \"Technology of Building Defects\" by John Hinks. Published by Taylor \u0026amp; Francis Ltd in 2016, this hardback edition spans 376 pages, providing an in-depth examination of building failures. Hinks approaches the topic by evaluating defects in the context of the entire building system rather than viewing them in isolation. This unique perspective not only enhances your understanding of the causes and implications of building defects but also equips you with the knowledge to prevent them in future constructions. Ideal for professionals and students alike, this book is an essential resource for anyone looking to deepen their expertise in the field of building technology. Don’t miss the opportunity to enhance your library with this vital reference on building defects.\u003c\/p\u003e","brand":"John Hinks","offers":[{"title":"Default Title","offer_id":52226934276438,"sku":"9781138177390","price":188.94,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9781138177390.jpg?v=1767740867"},{"product_id":"technology-of-building-defects-taylor-francis-ltd-9780419197805","title":"Technology of Building Defects","description":"\u003cp\u003eDiscover the comprehensive insights of \"Technology of Building Defects\" by Taylor \u0026amp; Francis Ltd, published in 1997. This enlightening paperback, spanning 376 pages, offers a unique, in-depth review of building defects that integrates them into the broader context of structural integrity. Unlike traditional approaches that isolate defects, this book emphasizes viewing them as integral aspects of the entire building. Ideal for architects, builders, and construction professionals, it serves as an essential reference for understanding and addressing building defects effectively. Enhance your knowledge and ensure quality in construction with this crucial resource.\u003c\/p\u003e","brand":"John Hinks","offers":[{"title":"Default Title","offer_id":52226935128406,"sku":"9780419197805","price":67.68,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780419197805.jpg?v=1767740869"},{"product_id":"studies-of-high-temperature-superconductors-volume-47-nova-science-publishers-inc-9781590338513-irradiation-effects-cationic-disorder-in-hts-anant-v-narlikar","title":"Studies of High Temperature Superconductors, Volume 47","description":"\u003cp\u003e\u003cstrong\u003eStudies of High Temperature Superconductors, Volume 47\u003c\/strong\u003e by A. V. Narlikar.\u003c\/p\u003e\n\u003cp\u003ePublished by Nova Science Publishers, (2003), Hardback, 234 pages.\u003c\/p\u003e\n\u003cp\u003eTopics: High temperature superconductors, Effect of radiation on, Defects, High temperature superconductivity.\u003c\/p\u003e","brand":"Anant V. Narlikar","offers":[{"title":"Default Title","offer_id":52227603235158,"sku":"9781590338513","price":130.73,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9781590338513.jpg?v=1767741994"},{"product_id":"structural-repair-of-traditional-buildings-taylor-francis-ltd-9781873394403-p-e-b-robson","title":"Structural Repair of Traditional Buildings","description":"\u003cp\u003eDelve into the intricacies of building preservation with \"Structural Repair of Traditional Buildings\" by P.E.B. Robson. Published by Taylor \u0026amp; Francis Ltd in 1999, this hardback edition spans 312 pages and is an invaluable resource for professionals engaged in the repair, maintenance, and refurbishment of traditional architecture. Robson expertly begins by detailing the fundamental mechanics of traditional structures and their interaction with the soil beneath them, offering insights into how these elements influence their integrity. The book further explores the complexities of structural design, emphasizing the necessity for adaptability in addressing unforeseen challenges. This comprehensive guide is essential for architects, engineers, and preservationists dedicated to maintaining the rich heritage of traditional buildings in the United Kingdom and beyond.\u003c\/p\u003e","brand":"P.E.B. Robson","offers":[{"title":"Default Title","offer_id":52227658318166,"sku":"9781873394403","price":188.94,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9781873394403.jpg?v=1767742091"},{"product_id":"stability-of-microstructure-in-metallic-systems-cambridge-university-press-9780521423168","title":"Stability of Microstructure in Metallic Systems","description":"\u003cp\u003eExplore the intricate world of metallic systems with the second revised edition of \u003cstrong\u003eStability of Microstructure in Metallic Systems\u003c\/strong\u003e by Cambridge University Press. Published in 1997 and spanning 444 pages, this comprehensive volume is an essential resource for final year undergraduates, graduate students, and research professionals. The updated text is well-illustrated and has gained popularity among both students and faculty for its clear explanations and insightful analysis. Dive into the complexities of microstructural stability and enhance your understanding of metallic systems through this meticulously designed book. Don't miss out on this valuable addition to your academic library!\u003c\/p\u003e","brand":"J. W. (University of Oxford) Martin","offers":[{"title":"Default Title","offer_id":52227903062358,"sku":"9780521423168","price":135.59,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780521423168.jpg?v=1767742469"},{"product_id":"random-non-random-periodic-faulting-in-crystals-gordon-breach-science-publishers-sa-9782881249259-p-krishna","title":"Random Non-Random Periodic Faulting in Crystals","description":"\u003cp\u003eExplore the intricate world of crystallography with \"Random Non-Random Periodic Faulting in Crystals\" by P. Krishna. Published in 1994 by Gordon \u0026amp; Breach Science Publishers SA, this hardback edition spans an impressive 400 pages and delves into the complexities of stacking faults in crystal structures. This informative text covers essential topics such as the notations used for representing close-packed structures, diverse types of faults, and advanced detection and measurement techniques including X-ray diffraction. Perfect for students and professionals alike, this book serves as a valuable resource in the study of the physical properties of crystals. Enhance your understanding of polymorphism and defects in crystals with this authoritative guide from an esteemed author in the field.\u003c\/p\u003e","brand":"P. Krishna","offers":[{"title":"Default Title","offer_id":52231173996886,"sku":"9782881249259","price":152.56,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9782881249259.jpg?v=1767747778"},{"product_id":"principles-and-applications-of-chemical-defects-taylor-francis-ltd-9780748739783-richard-j-d-tilley","title":"Principles and Applications of Chemical Defects","description":"\u003cp\u003eExplore the fascinating world of chemical defects in crystalline solids with \u003cstrong\u003ePrinciples and Applications of Chemical Defects\u003c\/strong\u003e by \u003cstrong\u003eRichard J.D. Tilley\u003c\/strong\u003e. Published by \u003cstrong\u003eTaylor \u0026amp; Francis Ltd\u003c\/strong\u003e in 1998, this comprehensive paperback spans \u003cstrong\u003e316 pages\u003c\/strong\u003e and delves into the intricate relationship between fundamental principles and real-world device applications.\u003c\/p\u003e \n\n\u003cp\u003eThis insightful book examines the chemical, optical, and electronic implications of defects within crystals, making it an essential read for students and professionals alike. Ideal for those studying chemistry, crystallography, or physical and theoretical science, it aligns with the National Curriculum Key Stage 2, providing a solid foundation for understanding essential concepts in the field. Enhance your knowledge and discover how chemical defects influence modern technology through this engaging and informative work.\u003c\/p\u003e","brand":"Richard J.D. Tilley","offers":[{"title":"Default Title","offer_id":52231792460118,"sku":"9780748739783","price":146.5,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780748739783.jpg?v=1767748864"},{"product_id":"positron-annihilation-in-semiconductors-springer-verlag-berlin-and-heidelberg-gmbh-co-kg-9783642084034-defect-studies-reinhard-krause-rehberg","title":"Positron Annihilation in Semiconductors","description":"\u003cp\u003eExplore the intricate world of semiconductors with \u003cstrong\u003ePositron Annihilation in Semiconductors\u003c\/strong\u003e by \u003cstrong\u003eReinhard Krause-Rehberg\u003c\/strong\u003e. Published by \u003cstrong\u003eSpringer-Verlag Berlin and Heidelberg GmbH \u0026amp; Co. KG\u003c\/strong\u003e in 2010, this comprehensive paperback edition spans \u003cstrong\u003e383 pages\u003c\/strong\u003e and serves as a vital resource for understanding lattice imperfections in semiconductors through the innovative technique of positron annihilation.\u003c\/p\u003e \n\n\u003cp\u003eThis book delves into the sensitivity range of positron annihilation, offering a detailed comparison with other defect-sensitive methods. Perfect for researchers and professionals in the field, it provides valuable insights into detecting and analyzing defects that can impact semiconductor performance. Whether you're a seasoned expert or a newcomer to semiconductor research, this book is an essential addition to your library.\u003c\/p\u003e \n\n\u003cp\u003eDiscover the cutting-edge methodologies and findings that are shaping the future of semiconductor technology with this pivotal work.\u003c\/p\u003e","brand":"Reinhard Krause-Rehberg","offers":[{"title":"Default Title","offer_id":52232107360598,"sku":"9783642084034","price":219.24,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9783642084034.jpg?v=1767749415"},{"product_id":"poor-quality-cost-taylor-francis-inc-9780824777432","title":"Poor-Quality Cost","description":"\u003cp\u003eDiscover the essential insights in \"Poor-Quality Cost\" by Taylor \u0026amp; Francis Inc, published in 1987. This informative hardback edition spans 224 pages and is designed to empower companies in developing an effective poor-quality-cost system. By implementing the strategies outlined in this book, management and employees can gain valuable data to identify areas for improvement, optimize their efforts, and accurately measure the progress of their improvement initiatives. Enhance your organization's performance and drive quality improvements with this essential resource. Perfect for professionals looking to refine their quality management practices, \"Poor-Quality Cost\" is a must-have addition to your business library.\u003c\/p\u003e","brand":"H.James Harrington","offers":[{"title":"Default Title","offer_id":52232188887382,"sku":"9780824777432","price":116.18,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780824777432.jpg?v=1767749562"},{"product_id":"photo-induced-defects-in-semiconductors-cambridge-university-press-9780521461962","title":"Photo-induced Defects in Semiconductors","description":"\u003cp\u003eDiscover the groundbreaking insights in \"Photo-induced Defects in Semiconductors\" by Cambridge University Press. Published in 1996, this essential hardback spans 230 pages and serves as the first comprehensive overview of deep-level, localized defects in semiconductors. Delve into the intricate world of metastable defects that interact with their surrounding materials, and learn how these interactions can profoundly influence the performance and stability of various semiconductor devices. This book is an invaluable resource for researchers and professionals seeking to understand the complexities of semiconductor behavior. Enhance your knowledge and stay ahead in the field with this authoritative guide.\u003c\/p\u003e","brand":"David (Stanford University, California) Redfield","offers":[{"title":"Default Title","offer_id":52232731296086,"sku":"9780521461962","price":99.21,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780521461962.jpg?v=1767750510"},{"product_id":"photo-induced-defects-in-semiconductors-cambridge-university-press-9780521024457-david-redfield","title":"Photo-induced Defects in Semiconductors","description":"\u003cp\u003eDiscover the intricate world of semiconductor technology with \u003cstrong\u003ePhoto-induced Defects in Semiconductors\u003c\/strong\u003e by \u003cstrong\u003eDavid Redfield\u003c\/strong\u003e, published by \u003cstrong\u003eCambridge University Press\u003c\/strong\u003e in 2006. This comprehensive volume spans \u003cstrong\u003e232 pages\u003c\/strong\u003e and serves as the first complete overview of deep-level, localized defects in semiconductors. Readers will gain insights into the complex interactions these metastable defects have with surrounding materials, which can significantly impact the performance and stability of various semiconductor devices. This essential resource is perfect for students, researchers, and professionals in the fields of physics, material science, and electronics. Enhance your understanding of semiconductor defects and their implications in modern technology with this indispensable guide.\u003c\/p\u003e","brand":"David Redfield","offers":[{"title":"Default Title","offer_id":52232731623766,"sku":"9780521024457","price":62.84,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780521024457.jpg?v=1767750512"},{"product_id":"particle-control-for-semiconductor-manufacturing-taylor-francis-inc-9780824782429","title":"Particle Control for Semiconductor Manufacturing","description":"\u003cp\u003eDiscover the fascinating world of semiconductor manufacturing with \u003cstrong\u003eParticle Control for Semiconductor Manufacturing\u003c\/strong\u003e, a comprehensive guide published by \u003cstrong\u003eTaylor \u0026amp; Francis Inc\u003c\/strong\u003e in 1990. This insightful hardback book spans \u003cstrong\u003e480 pages\u003c\/strong\u003e and delves into the critical impact that even the tiniest particles can have on the performance of computer chips. As technology advances and chips become smaller, understanding particle control becomes increasingly vital. This book offers an in-depth exploration of the challenges and solutions in maintaining the integrity of semiconductor surfaces. Perfect for professionals and enthusiasts in the field, \u003cstrong\u003eParticle Control for Semiconductor Manufacturing\u003c\/strong\u003e provides valuable knowledge that is essential for anyone involved in semiconductor technology. Enhance your understanding and ensure the reliability of your electronic devices with this essential resource.\u003c\/p\u003e","brand":"R.P. Donovan","offers":[{"title":"Default Title","offer_id":52233172025686,"sku":"9780824782429","price":419.31,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780824782429.jpg?v=1767751285"},{"product_id":"light-induced-defects-in-semiconductors-pan-stanford-publishing-pte-ltd-9789814411486-kazuo-morigaki","title":"Light-Induced Defects in Semiconductors","description":"\u003cp\u003e\u003cstrong\u003eLight-Induced Defects in Semiconductors\u003c\/strong\u003e by Kazuo Morigaki, Harumi Hikita, Chisato Ogihara.\u003c\/p\u003e\n\u003cp\u003ePublished by Taylor \u0026amp; Francis Group, (2014), Hardback, 212 pages.\u003c\/p\u003e\n\u003cp\u003eTopics: Light, Semiconductors, Defects, Semi-conducteurs.\u003c\/p\u003e","brand":"Kazuo Morigaki","offers":[{"title":"Default Title","offer_id":52236610896214,"sku":"9789814411486","price":140.44,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9789814411486.jpg?v=1767757466"},{"product_id":"large-angle-convergent-beam-electron-diffraction-applications-to-crystal-defects-taylor-francis-ltd-9782901483052-jean-paul-morniroli","title":"Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects","description":"\u003cp\u003eA publication of the French Society of Microscopies, this book is devoted to an important aspect of electron diffraction. The description of convergent-beam electron diffraction and of LACBED is preceded by several preparatory chapters, in which the principles of diffraction and the nature of electron-matter interactions are clearly set out.\u003c\/p\u003e","brand":"Jean-Paul Morniroli","offers":[{"title":"Default Title","offer_id":52237160251734,"sku":"9782901483052","price":116.18,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9782901483052.jpg?v=1767758303"},{"product_id":"laser-induced-damage-of-optical-materials-taylor-francis-ltd-9780750308458","title":"Laser-Induced Damage of Optical Materials","description":"\u003cp\u003eDiscover the intricate world of laser technology with \u003cstrong\u003eLaser-Induced Damage of Optical Materials\u003c\/strong\u003e, authored by experts in the field. Published by \u003cstrong\u003eTaylor \u0026amp; Francis Ltd\u003c\/strong\u003e in 2003, this hardback edition spans \u003cstrong\u003e241 pages\u003c\/strong\u003e of in-depth analysis and insights. The book provides a thorough examination of the damage processes that arise at high laser intensity levels, offering readers a clear understanding of how these factors can restrict the energy handling capabilities of optical systems. Whether you are a researcher, engineer, or enthusiast in optics and laser applications, this comprehensive overview is essential for grasping the complexities of laser-induced damage. Enhance your knowledge and ensure the longevity and performance of optical materials with this valuable resource.\u003c\/p\u003e","brand":"Roger M. (Cosolas Ltd., Herts, UK) Wood","offers":[{"title":"Default Title","offer_id":52237514441046,"sku":"9780750308458","price":231.38,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780750308458.jpg?v=1767758956"},{"product_id":"introduction-to-elasticity-theory-for-crystal-defects-world-scientific-publishing-co-pte-ltd-9789814749718-r-w-balluffi","title":"Introduction To Elasticity Theory For Crystal Defects","description":"\u003cp\u003eThe book presents a unified and self-sufficient and reader-friendly introduction to the anisotropic elasticity theory necessary to model a wide range of point, line, planar and volume type crystal defects (e.g., vacancies, dislocations, interfaces, inhomogeneities and inclusions).\u003c\/p\u003e","brand":"R. W. Balluffi","offers":[{"title":"Default Title","offer_id":52238254047574,"sku":"9789814749718","price":116.19,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9789814749718.jpg?v=1767760127"},{"product_id":"introduction-to-elasticity-theory-for-crystal-defects-world-scientific-publishing-co-pte-ltd-9789814749725-r-w-balluffi","title":"Introduction To Elasticity Theory For Crystal Defects","description":"\u003cp\u003eThe book presents a unified and self-sufficient and reader-friendly introduction to the anisotropic elasticity theory necessary to model a wide range of point, line, planar and volume type crystal defects (e.g., vacancies, dislocations, interfaces, inhomogeneities and inclusions).\u003c\/p\u003e","brand":"R. W. Balluffi","offers":[{"title":"Default Title","offer_id":52238257029462,"sku":"9789814749725","price":68.9,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9789814749725.jpg?v=1767760127"},{"product_id":"investigation-of-aeronautical-and-engineering-component-failures-taylor-francis-inc-9780849323140-a-venugopal-reddy","title":"Investigation of Aeronautical and Engineering Component Failures","description":"\u003cp\u003eDelve into the intricate world of failure analysis with \u003cstrong\u003eInvestigation of Aeronautical and Engineering Component Failures\u003c\/strong\u003e by \u003cstrong\u003eA. Venugopal Reddy\u003c\/strong\u003e. Published by Taylor \u0026amp; Francis Inc in 2004, this comprehensive hardback spans 368 pages, offering a systematic exploration of the principles, tools, and techniques essential for identifying the root causes of failures in aeronautics and engineering. \u003c\/p\u003e \u003cp\u003eThis essential resource covers the technical intricacies of failure analysis, including in-depth fracture feature analysis, and highlights critical aspects of component design and material selection. Perfect for professionals and students alike, this book serves as a vital reference in the fields of aerospace engineering and technology. Enhance your understanding of system failures and improve your knowledge of applied mathematics in engineering contexts with this authoritative guide.\u003c\/p\u003e","brand":"A. Venugopal Reddy","offers":[{"title":"Default Title","offer_id":52238782792022,"sku":"9780849323140","price":279.88,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780849323140.jpg?v=1767760728"},{"product_id":"introduction-to-elasticity-theory-for-crystal-defects-cambridge-university-press-9781107012554-r-w-balluffi","title":"Introduction to Elasticity Theory for Crystal Defects","description":"\u003cp\u003eAssuming no prior knowledge, Introduction to Elasticity Theory for Crystal Defects provides a user-friendly introduction for graduates and researchers. Covering all the key topics, with mathematical complexities clearly explained, the reader will gain a solid understanding of anisotropic elasticity theory. Exercises and solutions are included, making this the complete package.\u003c\/p\u003e","brand":"R. W. Balluffi","offers":[{"title":"Default Title","offer_id":52238959444310,"sku":"9781107012554","price":150.14,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9781107012554.jpg?v=1767760949"},{"product_id":"impurity-diffusion-and-gettering-in-silicon-volume-36-cambridge-university-press-9781107405608-richard-b-fair","title":"Impurity Diffusion and Gettering in Silicon: Volume 36","description":"\u003cp\u003eExplore the intricate world of semiconductor physics with \u003cstrong\u003eImpurity Diffusion and Gettering in Silicon: Volume 36\u003c\/strong\u003e by \u003cstrong\u003eRichard B. Fair\u003c\/strong\u003e. Published in 2014 by \u003cstrong\u003eCambridge University Press\u003c\/strong\u003e, this comprehensive volume spans 300 pages and serves as an essential reference for researchers and practitioners in the field. Delve into critical topics such as absorption and adsorption, diffusion, and the behavior of gases within silicon materials. This book is a valuable addition to the MRS Symposium Proceeding series, which is renowned for its contribution to the understanding of semiconductor technologies. Whether you are a seasoned expert or a newcomer to the field, this volume provides the insights and knowledge necessary to advance your research and applications in silicon technology.\u003c\/p\u003e","brand":"Richard B. Fair","offers":[{"title":"Default Title","offer_id":52239828812118,"sku":"9781107405608","price":33.74,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9781107405608.jpg?v=1767762160"},{"product_id":"imperfections-in-crystalline-solids-cambridge-university-press-9781107123137-wei-cai","title":"Imperfections in Crystalline Solids","description":"\u003cp\u003eDiscover the fascinating world of crystal defects with \u003cstrong\u003eImperfections in Crystalline Solids\u003c\/strong\u003e by \u003cstrong\u003eWei Cai\u003c\/strong\u003e. Published by \u003cstrong\u003eCambridge University Press\u003c\/strong\u003e in 2016, this comprehensive textbook spans \u003cstrong\u003e532 pages\u003c\/strong\u003e and is designed to equip students with a deep understanding of the properties of defects in crystalline solids.\u003c\/p\u003e \n\n\u003cp\u003eDrawing on fifty years of teaching experience, Wei Cai presents complex concepts in an accessible manner, making it an invaluable resource for advanced undergraduate and graduate courses. The book features worked examples and end-of-chapter exercises that reinforce learning, along with solutions and MATLAB® programs available online to enhance your study experience.\u003c\/p\u003e \n\n\u003cp\u003eWhether you're delving into energy-band theory or exploring crystalline rocks, this textbook is essential for anyone looking to master the intricacies of crystalline solid imperfections.\u003c\/p\u003e","brand":"Wei Cai","offers":[{"title":"Default Title","offer_id":52239939371350,"sku":"9781107123137","price":68.9,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9781107123137.jpg?v=1767762299"},{"product_id":"high-speed-vlsi-interconnections-john-wiley-sons-inc-9780471780465-ashok-k-goel","title":"High-Speed VLSI Interconnections","description":"\u003cp\u003eDiscover the latest advancements in Very Large Scale Integration (VLSI) with the Second Edition of \u003cstrong\u003eHigh-Speed VLSI Interconnections\u003c\/strong\u003e by Ashok K. Goel. Published by John Wiley \u0026amp; Sons Inc in 2007, this comprehensive hardback edition spans 432 pages and is an essential resource for anyone involved in integrated circuits and semiconductor technology.\u003c\/p\u003e \n\n\u003cp\u003eThis updated edition reflects significant developments in the field, featuring new sections on crucial topics such as Parasitic Inductances, Nanotechnology circuit interconnects, Electromigrations in copper interconnections, and Optical Interconnections. Whether you are a student, researcher, or industry professional, Goel's insightful analysis and mathematical models will enhance your understanding of high-speed integrated circuits and their complexities.\u003c\/p\u003e \n\n\u003cp\u003eElevate your knowledge and stay at the forefront of VLSI technology with this indispensable guide.\u003c\/p\u003e","brand":"Ashok K. Goel","offers":[{"title":"Default Title","offer_id":52241401643350,"sku":"9780471780465","price":202.22,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780471780465.jpg?v=1767764011"},{"product_id":"fault-detection-nova-science-publishers-inc-9781628089998-classification-techniques-role-in-industrial-systems-fausto-pedro-garca-mrquez","title":"Fault Detection","description":"\u003cp\u003e\u003cstrong\u003eFault Detection\u003c\/strong\u003e by Fausto Pedro Garca Mrquez, Mayorkinos Papaelias.\u003c\/p\u003e\n\u003cp\u003ePublished by Nova Science Publishers, Incorporated, (2014), Hardback, 219 pages.\u003c\/p\u003e\n\u003cp\u003eTopics: System failures (engineering), Fault location (Engineering), Defects, System failures (Engineering).\u003c\/p\u003e","brand":"Fausto Pedro Garca Mrquez","offers":[{"title":"Default Title","offer_id":52243785449814,"sku":"9781628089998","price":237.43,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9781628089998.jpg?v=1767767116"},{"product_id":"fault-detection-nova-science-publishers-inc-9781617282911-theory-methods-systems-l-a-m-simon","title":"Fault Detection","description":"\u003cp\u003e\u003cstrong\u003eFault Detection\u003c\/strong\u003e by Léa M. Simon.\u003c\/p\u003e\n\u003cp\u003ePublished by Nova Science Publishers, (2011), Hardback, 302 pages.\u003c\/p\u003e\n\u003cp\u003eTopics: Defects, Fault location (Engineering), Dynamic testing.\u003c\/p\u003e","brand":"Léa M. Simon","offers":[{"title":"Default Title","offer_id":52243785810262,"sku":"9781617282911","price":141.64,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9781617282911.jpg?v=1767767117"},{"product_id":"extended-defects-in-semiconductors-cambridge-university-press-9781107424142-electronic-properties-device-effects-and-structures-d-b-holt","title":"Extended Defects in Semiconductors","description":"\u003cp\u003eA discussion of the basic properties of structurally extended defects, their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics.\u003c\/p\u003e","brand":"D. B. Holt","offers":[{"title":"Default Title","offer_id":52244826554710,"sku":"9781107424142","price":88.3,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9781107424142.jpg?v=1767768703"},{"product_id":"extended-defects-in-semiconductors-cambridge-university-press-9780521819343-electronic-properties-device-effects-and-structures-d-b-holt","title":"Extended Defects in Semiconductors","description":"\u003cp\u003eA discussion of the basic properties of structurally extended defects, their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics.\u003c\/p\u003e","brand":"D. B. Holt","offers":[{"title":"Default Title","offer_id":52244827341142,"sku":"9780521819343","price":162.26,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780521819343.jpg?v=1767768702"},{"product_id":"dopants-and-defects-in-semiconductors-taylor-francis-ltd-9781138035195-matthew-d-mccluskey","title":"Dopants and Defects in Semiconductors","description":"\u003cp\u003eThis revised edition continues to provide the most complete coverage of the fundamental knowledge of semiconductors. In addition to inclusion of new chapter problems and worked examples, it delves into solid-state lighting (LEDs and laser diodes), and offers a solid foundation for experimental methods and the theory of defects in semiconductors.\u003c\/p\u003e","brand":"Matthew D. McCluskey","offers":[{"title":"Default Title","offer_id":52246686597462,"sku":"9781138035195","price":243.5,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9781138035195.jpg?v=1767771659"},{"product_id":"defects-in-optoelectronic-materials-gordon-and-breach-9789056997144-kazumi-wada","title":"Defects in Optoelectronic Materials","description":"\u003cp\u003e\u003cstrong\u003eDefects in Optoelectronic Materials\u003c\/strong\u003e by Kazumi Wada.\u003c\/p\u003e\n\u003cp\u003ePublished by Gordon and Breach Science Publishers, (2001), Hardback, 426 pages.\u003c\/p\u003e\n\u003cp\u003eTopics: Materials, Optoelectronics, Defects, Optoelectronic devices.\u003c\/p\u003e","brand":"Kazumi Wada","offers":[{"title":"Default Title","offer_id":52246707896662,"sku":"9789056997144","price":195.0,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9789056997144.jpg?v=1767771689"},{"product_id":"defects-in-microelectronic-materials-and-devices-taylor-francis-inc-9781420043761-daniel-fleetwood","title":"Defects in Microelectronic Materials and Devices","description":"\u003cp\u003eExplore the intricate world of microelectronics with \u003cstrong\u003eDefects in Microelectronic Materials and Devices\u003c\/strong\u003e by \u003cstrong\u003eDaniel Fleetwood\u003c\/strong\u003e. Published by \u003cstrong\u003eTaylor \u0026amp; Francis Inc\u003c\/strong\u003e in 2008, this comprehensive hardback spans an impressive \u003cstrong\u003e770 pages\u003c\/strong\u003e, offering an in-depth survey of defects in silicon-based metal-oxide semiconductor field-effect transistor (MOSFET) technologies. \u003c\/p\u003e \n\n\u003cp\u003eDelve into the complexities of flaws found in linear bipolar technologies, as well as silicon carbide-based devices and gallium arsenide materials. This essential resource is ideal for professionals and students alike, providing critical insights into microelectronics, materials testing, and nanotechnology. Whether you're involved in integrated circuits or material science, this book presents valuable knowledge to enhance your understanding of defects in microelectronic materials and devices.\u003c\/p\u003e","brand":"Daniel Fleetwood","offers":[{"title":"Default Title","offer_id":52246707994966,"sku":"9781420043761","price":243.5,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9781420043761.jpg?v=1767771690"},{"product_id":"defect-and-impurity-engineered-semiconductors-and-devices-volume-378-materials-research-society-9781558992818-s-ashok","title":"Defect and Impurity Engineered Semiconductors and Devices: Volume 378","description":"\u003cp\u003eDiscover the cutting-edge advancements in semiconductor technology with \u003cstrong\u003eDefect and Impurity Engineered Semiconductors and Devices: Volume 378\u003c\/strong\u003e by S. Ashok. Published by the Materials Research Society in 1995, this comprehensive hardback spans an impressive 1082 pages, making it an essential resource for both academic and industrial researchers. \u003c\/p\u003e \n\n\u003cp\u003eThis volume delves into the evolution of defect engineering, showcasing its significance in the semiconductor field. It goes beyond mere defect control, examining how the intentional introduction and manipulation of defects and impurities can enhance the properties of semiconductor materials and devices. Whether you are a student, researcher, or industry professional, this book provides valuable insights into the intricate relationship between defects and the performance of electronic components.\u003c\/p\u003e \n\n\u003cp\u003eElevate your understanding of semiconductor engineering and explore the transformative potential of defect and impurity engineering with this authoritative guide.\u003c\/p\u003e","brand":"S. Ashok","offers":[{"title":"Default Title","offer_id":52246708584790,"sku":"9781558992818","price":31.31,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9781558992818.jpg?v=1767771691"},{"product_id":"defects-and-damage-in-composite-materials-and-structures-taylor-francis-inc-9781466580473-rikard-benton-heslehurst","title":"Defects and Damage in Composite Materials and Structures","description":"","brand":"Rikard Benton Heslehurst","offers":[{"title":"Default Title","offer_id":52246709043542,"sku":"9781466580473","price":285.94,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9781466580473.jpg?v=1767771692"},{"product_id":"deep-centers-in-semiconductors-gordon-breach-science-publishers-sa-9782881245626-sokrates-t-pantelides","title":"Deep Centers in Semiconductors","description":"\u003cp\u003eDiscover the intricate world of semiconductor physics with \u003cstrong\u003eDeep Centers in Semiconductors\u003c\/strong\u003e by \u003cstrong\u003eSokrates T. Pantelides\u003c\/strong\u003e, published by Gordon \u0026amp; Breach Science Publishers SA in 1992. This comprehensive hardback edition spans an impressive \u003cstrong\u003e944 pages\u003c\/strong\u003e and delves into the fundamental concepts of deep centers within semiconductors.\u003c\/p\u003e \n\n\u003cp\u003ePantelides expertly examines a selection of key semiconductor deep centers, illustrating a variety of essential principles. These deep centers, characterized as lattice defects or impurities, create localized bound states and energies deep within the band gap, significantly impacting the electrical properties of semiconductors.\u003c\/p\u003e \n\n\u003cp\u003eWhether you're a student, researcher, or professional in the field of condensed matter physics, this book is an invaluable resource for understanding the complexities of impurity centers and their role in semiconductor technology. Enhance your knowledge of magnetism, electromagnetism, and the behavior of electron donor-acceptor complexes with this essential text.\u003c\/p\u003e","brand":"Sokrates T. Pantelides","offers":[{"title":"Default Title","offer_id":52246725853526,"sku":"9782881245626","price":546.62,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9782881245626.jpg?v=1767771717"},{"product_id":"defects-and-radiation-damage-in-metals-cambridge-university-press-9780521098656-m-w-thompson","title":"Defects and Radiation Damage in Metals","description":"\u003cp\u003eExplore the intricate world of materials science with \"Defects and Radiation Damage in Metals\" by M. W. Thompson, published by Cambridge University Press in 1974. This comprehensive 442-page paperback delves into the basic atomic mechanisms that lead to significant effects induced by radiation in metals. Professor Thompson expertly illustrates how the relatively simple structures of metals make it easier to identify these fundamental processes. Ideal for students and professionals in physics and materials science, this book serves as an essential resource for understanding the complexities of radiation damage. Enhance your knowledge and broaden your perspective on the impact of radiation on metallic structures with this insightful work.\u003c\/p\u003e","brand":"M. W. Thompson","offers":[{"title":"Default Title","offer_id":52247518118230,"sku":"9780521098656","price":56.77,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780521098656.jpg?v=1767772957"},{"product_id":"defects-and-deterioration-in-buildings-taylor-francis-ltd-9780419252108-a-practical-guide-to-the-science-and-technology-of-material-failure","title":"Defects and Deterioration in Buildings","description":"\u003cp\u003e\"Defects and Deterioration in Buildings,\" authored by Taylor \u0026amp; Francis Ltd, is an essential professional reference for anyone involved in the construction and maintenance of buildings. This comprehensive second edition, published in 2000, spans 220 pages and is specifically designed to assist surveyors, engineers, architects, and contractors in diagnosing existing problems in structures. It also provides valuable insights on how to avoid these issues in new buildings. Whether you are a seasoned professional or a newcomer to the field, this book offers practical guidance and expert advice critical for maintaining the integrity of building projects. Enhance your knowledge and ensure the longevity of your constructions with this indispensable resource.\u003c\/p\u003e","brand":"Barry Richardson","offers":[{"title":"Default Title","offer_id":52247518740822,"sku":"9780419252108","price":195.0,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780419252108.jpg?v=1767772960"},{"product_id":"defect-recognition-and-image-processing-in-semiconductors-1997-taylor-francis-ltd-9780750305006-proceedings-of-the-seventh-conference-on-defect-recognition-and-image-processing-berlin-september-1997-germany-international-conference-on-defect-recognition-a","title":"Defect Recognition and Image Processing in Semiconductors 1997","description":"\u003cp\u003eDiscover the essential insights into semiconductor technology with \u003cstrong\u003eDefect Recognition and Image Processing in Semiconductors\u003c\/strong\u003e, edited by the \u003cstrong\u003eInternational Conference on Defect Recognition and Image Processing in Semiconductors\u003c\/strong\u003e held in Templin, Germany, in 1997. Published in 1998, this comprehensive hardback edition spans \u003cstrong\u003e524 pages\u003c\/strong\u003e and delves into advanced techniques for assessing, monitoring, and characterizing defects at both atomic scales and in complete silicon wafers.\u003c\/p\u003e \n\n\u003cp\u003eThis book explores the latest advancements in defect analysis techniques and instrumentation, providing valuable applications for substrates, epilayers, and devices. It offers in-depth investigations into defects in layers and devices, making it an invaluable resource for professionals in materials science, reliability engineering, and condensed matter physics.\u003c\/p\u003e \n\n\u003cp\u003eEnhance your understanding of semiconductor technology and defect recognition with this authoritative guide that bridges the gap between theoretical knowledge and practical applications.\u003c\/p\u003e","brand":"Germany) International Conference on Defect Recognition and Image Processing in Semiconductors (7th : 1997 : Templin","offers":[{"title":"Default Title","offer_id":52247518904662,"sku":"9780750305006","price":516.31,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780750305006.jpg?v=1767772958"},{"product_id":"defects-and-damage-in-composite-materials-and-structures-taylor-francis-ltd-9781138073692-rikard-benton-heslehurst","title":"Defects and Damage in Composite Materials and Structures","description":"","brand":"Rikard Benton Heslehurst","offers":[{"title":"Default Title","offer_id":52247518839126,"sku":"9781138073692","price":110.12,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9781138073692.jpg?v=1767772958"},{"product_id":"crystals-defects-and-microstructures-cambridge-university-press-9780521790055-modeling-across-scales-rob-phillips","title":"Crystals, Defects and Microstructures","description":"\u003cp\u003eExplores one of the central tenets, the structure-property paradigm, which proposes a direct connection between the geometric structures within a material and its properties. Ideal for graduate students and researchers.\u003c\/p\u003e","brand":"Rob Phillips","offers":[{"title":"Default Title","offer_id":52247978606934,"sku":"9780521790055","price":228.95,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780521790055.jpg?v=1767773722"},{"product_id":"contamination-of-electronic-assemblies-taylor-francis-inc-9780849314834-michael-pecht","title":"Contamination of Electronic Assemblies","description":"\u003cp\u003eExplore the critical issues surrounding contamination in electronic assemblies with \u003cstrong\u003eContamination of Electronic Assemblies\u003c\/strong\u003e by \u003cstrong\u003eMichael Pecht\u003c\/strong\u003e. Published by Taylor \u0026amp; Francis Inc in 2002, this essential hardback spans 234 pages and serves as a comprehensive guide for engineers and professionals in the electronics field.\u003c\/p\u003e \n\n\u003cp\u003eAs contamination problems increasingly impact the manufacture, quality, and reliability of electronic components, understanding the underlying mechanics and chemistry is vital for enhancing production standards. This book provides a thorough overview of contamination challenges while offering practical problem-solving strategies to mitigate defects in electronic packaging and circuits.\u003c\/p\u003e \n\n\u003cp\u003eWhether you are involved in microelectronics, quality control, or reliability engineering, \u003cstrong\u003eContamination of Electronic Assemblies\u003c\/strong\u003e is an invaluable resource for improving factory sanitation and ensuring optimal performance in electronic assembly processes.\u003c\/p\u003e","brand":"Michael Pecht","offers":[{"title":"Default Title","offer_id":52248590123350,"sku":"9780849314834","price":334.44,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780849314834.jpg?v=1767774692"},{"product_id":"coating-and-drying-defects-john-wiley-sons-inc-9780471713685-troubleshooting-operating-problems-edgar-b-gutoff","title":"Coating and Drying Defects","description":"\u003cp\u003eDiscover the essential resource for industry professionals with \u003cstrong\u003eCoating and Drying Defects\u003c\/strong\u003e by \u003cstrong\u003eEdgar B. Gutoff\u003c\/strong\u003e. Published by \u003cstrong\u003eJohn Wiley \u0026amp; Sons Inc\u003c\/strong\u003e in 2006, this comprehensive guide spans 368 pages and is now in its second edition. It addresses the critical challenges faced in the coating and drying industry, where precision is paramount. As new technologies emerge, including fuel cell membranes, thin film batteries, solar cells, and RFID chips, the demand for defect-free coatings has never been higher. This book provides practical insights and expert solutions to help you navigate the complexities of coatings and drying processes, ensuring high-quality results every time. Equip yourself with the knowledge to excel in a competitive market and maintain the highest standards in your work.\u003c\/p\u003e","brand":"Edgar B. Gutoff","offers":[{"title":"Default Title","offer_id":52249460080982,"sku":"9780471713685","price":187.67,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780471713685.jpg?v=1767776001"},{"product_id":"building-facades-a-guide-to-common-defects-in-tropical-climates-world-scientific-publishing-co-pte-ltd-9789810234171","title":"Building Facades: A Guide To Common Defects In Tropical Climates","description":"\u003cp\u003eDiscover the essential insights in \u003cstrong\u003eBuilding Facades: A Guide To Common Defects In Tropical Climates\u003c\/strong\u003e, authored by experts in the field and published by World Scientific Publishing Co Pte Ltd in 1998. This informative hardback edition spans 80 pages and serves as a crucial resource for architects, builders, and construction professionals. \u003c\/p\u003e \u003cp\u003eThis guide meticulously explores the various types of defects that can occur on building facades in tropical environments. It covers a range of facade materials, including natural stone, glass, metal sheeting, plaster, and tiling. Additionally, the book evaluates the causes of these defects, such as poor workmanship, providing readers with a comprehensive understanding of the challenges faced in tropical construction. \u003c\/p\u003e \u003cp\u003eWhether you are involved in design, construction, or maintenance, this book is an invaluable tool for ensuring the longevity and integrity of building facades in challenging climates.\u003c\/p\u003e","brand":"Yit Lin Michael (Nus, S'pore) Chew","offers":[{"title":"Default Title","offer_id":52249979355478,"sku":"9789810234171","price":44.65,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9789810234171.jpg?v=1767776778"},{"product_id":"alkali-aggregate-reaction-in-concrete-taylor-francis-ltd-9781138027565-a-world-review-alan-b-poole","title":"Alkali-Aggregate Reaction in Concrete","description":"\u003cp\u003e\u003cstrong\u003eAlkali-Aggregate Reaction in Concrete\u003c\/strong\u003e by Alan B. Poole, Ian Sims.\u003c\/p\u003e\n\u003cp\u003ePublished by Taylor \u0026amp; Francis Group, (2017), Hardback, 804 pages.\u003c\/p\u003e\n\u003cp\u003eTopics: Concrete, Composite materials, Defects, Alkali-aggregate reactions.\u003c\/p\u003e","brand":"Alan B. Poole","offers":[{"title":"Default Title","offer_id":52253673652566,"sku":"9781138027565","price":285.94,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9781138027565.jpg?v=1767782232"}],"url":"https:\/\/www.bookshop.ee\/collections\/defektai.oembed","provider":"Bookshop","version":"1.0","type":"link"}