{"title":"Väga suure integratsiooniga skeemid","description":"\u003cp\u003e\u003cstrong\u003eVäga suure integratsiooniga skeemid\u003c\/strong\u003e – autori raamatud meie kataloogis: 3 raamatut. Vaata kõiki väljaandeid ja telli internetist üle Eesti.\u003c\/p\u003e","products":[{"product_id":"advanced-vlsi-design-and-testability-issues-taylor-francis-ltd-9780367538361-suman-lata-tripathi","title":"Advanced VLSI Design and Testability Issues","description":"\u003cp\u003eThis book provides in-depth knowledge of VLSI and also the broad aspects of it by explaining its applications in different fields e.g. image processing and biomedical. The role of fault simulation algorithms is very well explained and its implementation using Verilog is the key aspect of this book.\u003c\/p\u003e","brand":"Suman Lata Tripathi","offers":[{"title":"Default Title","offer_id":52280875352406,"sku":"9780367538361","price":56.77,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780367538361.jpg?v=1767826398"},{"product_id":"advanced-vlsi-design-and-testability-issues-taylor-francis-ltd-9780367492823-suman-lata-tripathi","title":"Advanced VLSI Design and Testability Issues","description":"\u003cp\u003eThis book provides in-depth knowledge of VLSI and also the broad aspects of it by explaining its applications in different fields e.g. image processing and biomedical. The role of fault simulation algorithms is very well explained and its implementation using Verilog is the key aspect of this book.\u003c\/p\u003e","brand":"Suman Lata Tripathi","offers":[{"title":"Default Title","offer_id":52280875581782,"sku":"9780367492823","price":140.44,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780367492823.jpg?v=1767826398"},{"product_id":"advanced-high-speed-devices-world-scientific-publishing-co-pte-ltd-9789814287869-ieee-lester-eastman-conference-on-high-performance-devices-2008-cornell-university","title":"Advanced High Speed Devices","description":"\u003cp\u003eDiscover cutting-edge advancements in semiconductor technology with \u003cstrong\u003eAdvanced High Speed Devices\u003c\/strong\u003e, a comprehensive volume presented by the \u003cstrong\u003eIEEE Lester Eastman Conference on High Performance Devices\u003c\/strong\u003e and published by \u003cstrong\u003eWorld Scientific Publishing Co Pte Ltd\u003c\/strong\u003e in 2009. Spanning 204 pages, this essential resource is tailored for device and electronics engineers, as well as scientists eager to explore the latest developments in high-speed electronics.\u003c\/p\u003e \n\n\u003cp\u003eThis book delves into five key areas of advanced device technology, including terahertz and high-speed electronics, ultraviolet emitters and detectors, advanced III-V field effect transistors, III-N materials and devices, and SiC devices. Each section provides in-depth insights and technical details, making it a valuable addition to your professional library. Stay at the forefront of innovation in integrated circuits and very large scale integration with this authoritative guide.\u003c\/p\u003e","brand":"IEEE Lester Eastman Conference on High Performance Devices (2008 Cornell University)","offers":[{"title":"Default Title","offer_id":52280896717142,"sku":"9789814287869","price":142.86,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9789814287869.jpg?v=1767826445"}],"url":"https:\/\/www.bookshop.ee\/collections\/very-large-scale-integration.oembed","provider":"Bookshop","version":"1.0","type":"link"}