Photo-induced Defects in Semiconductors

Discover the groundbreaking insights in "Photo-induced Defects in Semiconductors" by Cambridge University Press. Published in 1996, this essential hardback spans 230 pages and serves as the first comprehensive overview of deep-level, localized defects in semiconductors. Delve into the intricate world of metastable defects that interact with their surrounding materials, and learn how these interactions can profoundly influence the performance and stability of various semiconductor devices. This book is an invaluable resource for researchers and professionals seeking to understand the complexities of semiconductor behavior. Enhance your knowledge and stay ahead in the field with this authoritative guide.