XAFS for Everyone

Discover the essential insights of "XAFS for Everyone," authored by Scott Calvin and published by Taylor & Francis Ltd in 2024. This comprehensive second edition spans 420 pages and is designed to make X-ray Absorption Fine Structure (XAFS) accessible to all readers, regardless of their background. This updated version includes new chapters focusing on spatial and temporal resolution, as well as alternative measurement modes such as resonant inelastic x-ray scattering (RIXS) and high-energy resolution fluorescence detection (HERFD). Additionally, readers will benefit from an expanded chapter on experimental design, making this book a vital resource for both beginners and seasoned researchers in the field of physics. Enhance your understanding of XAFS with this engaging and informative guide!