Defektid

Defektid – sellest kategooriast leiad 59 raamatut. Tunnustatud klassikast uusimate väljaanneteni. Telli internetist, tarnime üle Eesti.

Defektid

Näitan 1-50 / 57+
12
Ehitusvigade mõistmine
James Douglas
€72,53-4%
€75,24
Laos
Investigation of Aeronautical and Engineering Component Failures
A. Venugopal Reddy
€279,88-3%
€289,00
Laos
Building Surveys and Reports
James Douglas
€63,99-4%
€66,44
Laos
Theory of Radiation Processes in Metal Solid Solutions
Yu V. Trushin
€179,23-3%
€185,24
Laos
Deep Centers in Semiconductors
Sokrates T. Pantelides
€546,62-3%
€564,00
Tarne 3-4 näd
Defects in Microelectronic Materials and Devices
Daniel Fleetwood
€243,50-3%
€251,50
Tarne 3-4 näd
Defects in Optoelectronic Materials
Kazumi Wada
€195,00-3%
€201,50
Tarne 3-4 näd
Defects and Damage in Composite Materials and Structures
Rikard Benton Heslehurst
€285,94-3%
€295,25
Tarne 3-4 näd
Introduction to Elasticity Theory for Crystal Defects
R. W. Balluffi
€150,14-3%
€155,25
Tarne 3-4 näd
Introduction To Elasticity Theory For Crystal Defects
R. W. Balluffi
€68,90-4%
€71,50
Tarne 3-4 näd
Introduction To Elasticity Theory For Crystal Defects
R. W. Balluffi
€116,19-3%
€120,25
Tarne 3-4 näd
Laser-Induced Damage of Optical Materials
Roger M. (Cosolas Ltd., Herts, UK) Wood
€231,38-3%
€239,00
Tarne 3-4 näd
Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects
Jean-Paul Morniroli
€116,18-3%
€120,24
Tarne 3-4 näd
Light-Induced Defects in Semiconductors
Kazuo Morigaki
€140,44-3%
€145,25
Tarne 3-4 näd
Eluasemeprobleemide mõistmine
Roger Heath
€90,72-3%
€93,99
Tarne 3-4 näd
Dopants and Defects in Semiconductors
Matthew D. McCluskey
€243,50-3%
€251,50
Tarne 3-4 näd
Particle Control for Semiconductor Manufacturing
R.P. Donovan
€419,31-3%
€432,75
Tarne 3-4 näd
Photo-induced Defects in Semiconductors
David Redfield
€62,84-4%
€65,25
Tarne 3-4 näd
Photo-induced Defects in Semiconductors
David (Stanford University, California) Redfield
€99,21-3%
€102,75
Tarne 3-4 näd
Poor-Quality Cost
H.James Harrington
€116,18-3%
€120,24
Tarne 3-4 näd
Positron Annihilation in Semiconductors
Reinhard Krause-Rehberg
€219,24-3%
€226,49
Tarne 3-4 näd
Principles and Applications of Chemical Defects
Richard J.D. Tilley
€146,50-3%
€151,50
Tarne 3-4 näd
Random Non-Random Periodic Faulting in Crystals
P. Krishna
€152,56-3%
€157,75
Tarne 3-4 näd
Stability of Microstructure in Metallic Systems
J. W. (University of Oxford) Martin
€135,59-3%
€140,25
Tarne 3-4 näd
Structural Repair of Traditional Buildings
P.E.B. Robson
€188,94-3%
€195,25
Tarne 3-4 näd
Studies of High Temperature Superconductors, Volume 47
Anant V. Narlikar
€130,73-3%
€135,24
Tarne 3-4 näd
Extended Defects in Semiconductors
D. B. Holt
€162,26-3%
€167,75
Tarne 3-4 näd
Technology of Building Defects
John Hinks
€188,94-3%
€195,25
Tarne 3-4 näd
Technology of Building Defects
John Hinks
€67,68-4%
€70,24
Tarne 3-4 näd
Toyota Automobiles & Unintended Acceleration
Craig A. Orrigo
€345,34-3%
€356,49
Tarne 3-4 näd
Dopants and Defects in Semiconductors
Matthew D. McCluskey
€62,83-4%
€65,24
Tarne 3-4 näd
Dynamics and Defects in Liquid Crystals
Peter Palffy-Muhoray
€298,06-3%
€307,75
Tarne 3-4 näd
Physical Chemistry of Ionic Materials
Joachim Maier
€122,19-3%
€126,44
Tarne 3-4 näd
Poor-Quality Cost
H. J. Harrington
€82,23-4%
€85,24
Tarne 3-4 näd
71st Conference on Glass Problems
Charles H., III, III (The Ohio State University, USA) Drummond
€95,52-3%
€98,94
Tarne 3-4 näd
72nd Conference on Glass Problems
Charles H. Drummond III
€93,09-3%
€96,44
Tarne 3-4 näd
Extended Defects in Semiconductors
D. B. Holt
€88,30-3%
€91,50
Tarne 3-4 näd
Alkali-Aggregate Reaction in Concrete
Alan B. Poole
€285,94-3%
€295,25
Tarne 3-4 näd
Building Facades: A Guide To Common Defects In Tropical Climates
Yit Lin Michael (Nus, S'pore) Chew
€44,65-4%
€46,50
Tarne 3-4 näd
Coating and Drying Defects
Edgar B. Gutoff
€187,67-3%
€193,94
Tarne 3-4 näd
Contamination of Electronic Assemblies
Michael Pecht
€334,44-3%
€345,25
Tarne 3-4 näd
Crystals, Defects and Microstructures
Rob Phillips
€228,95-3%
€236,50
Tarne 3-4 näd
Defect Recognition and Image Processing in Semiconductors 1997
Germany) International Conference on Defect Recognition and Image Processing in Semiconductors (7th : 1997 : Templin
€516,31-3%
€532,75
Tarne 3-4 näd
Defects and Radiation Damage in Metals
M. W. Thompson
€56,77-4%
€59,00
Tarne 3-4 näd
Defects and Deterioration in Buildings
Barry Richardson
€195,00-3%
€201,50
Tarne 3-4 näd
Defects and Damage in Composite Materials and Structures
Rikard Benton Heslehurst
€110,12-3%
€113,99
Tarne 3-4 näd
Fault Detection
Fausto Pedro Garca Mrquez
€237,43-3%
€245,24
Tarne 3-4 näd
Fault Detection
Léa M. Simon
€141,64-3%
€146,49
Tarne 3-4 näd
12