Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation

"Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation" by M. E. Fitzpatrick is a pivotal resource for engineering professionals and researchers alike. Published by Taylor & Francis Ltd in 2020, this comprehensive paperback spans 368 pages and offers an in-depth exploration of neutron and synchrotron X-ray diffraction techniques, which are at the forefront of stress analysis. The book not only elucidates the fundamental principles of these advanced methods but also showcases a variety of applications across different materials and engineering challenges. Featuring contributions from 20 leading international experts in the field of residual stress analysis, this volume serves as an essential reference for anyone looking to deepen their understanding of these innovative techniques. Whether you are a seasoned engineer or a student, this book will enhance your knowledge and practical skills in the analysis of residual stress.