• Book cover of: Applied Measurement with jMetrik. By: J. Patrick Meyer

Applied Measurement with jMetrik

J. Patrick Meyer

€206,12
€206,12 €212,50 Väljamüük

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Autorius J. Patrick Meyer
Leidimo metai 2014 m.
Puslapių skč. 170 psl.
Viršelis Kietas viršelis
ISBN 9780415531955

Applied Measurement with jMetrik

Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis.

Book cover of: Applied Measurement with jMetrik. By: J. Patrick Meyer

Applied Measurement with jMetrik

€206,12
€206,12 €212,50