• Book cover of: Fundamentals Of Atomic Force Microscopy - Part I: Foundations. By: Ronald G. Reifenberger

Fundamentals Of Atomic Force Microscopy - Part I: Foundations

Ronald G. Reifenberger

€115,19
€115,19 €118,75 Väljamüük

Meil on laos

📦 Šios prekės gali nebūti sandėlyje.
Prieš perkant parašykite mums, kad patikslintume: info@bookshop.lt 💜

Leidimo metai 2015 m.
Puslapių skč. 340 psl.
Viršelis Kietas viršelis
ISBN 9789814630344

Fundamentals Of Atomic Force Microscopy - Part I: Foundations

The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution.

Book cover of: Fundamentals Of Atomic Force Microscopy - Part I: Foundations. By: Ronald G. Reifenberger

Fundamentals Of Atomic Force Microsco...

€115,19
€115,19 €118,75