• Book cover of: Multi-run Memory Tests for Pattern Sensitive Faults. By: Ireneusz Mrozek

Multi-run Memory Tests for Pattern Sensitive Faults

Ireneusz Mrozek

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Autorius Ireneusz Mrozek
Kalba Anglų k.
Leidimo metai 2018 m.
Puslapių skč. 135 psl.
Viršelis Kietas viršelis
ISBN 9783319912035
Leidimas 1st ed. 2019

Multi-run Memory Tests for Pattern Sensitive Faults

This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory.

Book cover of: Multi-run Memory Tests for Pattern Sensitive Faults. By: Ireneusz Mrozek

Multi-run Memory Tests for Pattern Se...

€55,55
€55,55 €57,74