Photo-induced Defects in Semiconductors

Discover the intricate world of semiconductor technology with Photo-induced Defects in Semiconductors by David Redfield, published by Cambridge University Press in 2006. This comprehensive volume spans 232 pages and serves as the first complete overview of deep-level, localized defects in semiconductors. Readers will gain insights into the complex interactions these metastable defects have with surrounding materials, which can significantly impact the performance and stability of various semiconductor devices. This essential resource is perfect for students, researchers, and professionals in the fields of physics, material science, and electronics. Enhance your understanding of semiconductor defects and their implications in modern technology with this indispensable guide.