Surface and Thin Film Analysis

Discover the comprehensive insights offered in the Surface and Thin Film Analysis by Gernot Friedbacher, a must-have resource for professionals and researchers in the field. This second and completely revised edition, published by Wiley-VCH Verlag GmbH in 2011, spans an impressive 558 pages of in-depth analysis and comparison of all techniques relevant to practical applications in electron spectroscopy.

This updated edition features new chapters that delve into cutting-edge methods such as SNOM (Scanning Near-field Optical Microscopy), SERS (Surface-Enhanced Raman Scattering), and laser ablation, ensuring that readers are equipped with the latest advancements in technology. With over 500 references and a comprehensive list of equipment suppliers, this book serves as a valuable tool for anyone looking to enhance their knowledge and expertise in surface and thin film analysis.