• Book cover of: Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Sandeep K. (TSMC Technology Inc., San Jose, California, USA) Goel

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Kalba Anglų k.
Leidimo metai 2013 m.
Puslapių skč. 259 psl.
Viršelis Kietas viršelis
ISBN 9781439829417

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits by Krishnendu Chakrabarty, Sandeep K. Goel.

Published by CRC Press, (2012), Hardback, 259 pages.

Topics: Metal oxide semiconductors, complementary, Nanotechnology, Complementary Metal oxide semiconductors.

Book cover of: Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Testing for Small-Delay Defects in Na...

€267,75
€267,75 €276,50